| 摘要 |
<p>The invention relates to a method for optimising the measuring times of a measuring device for testing standard parts. According to the method: a measurement with a reduced measuring time t' is carried out on an object to be measured in order to detect a measured value, the length of the measuring time being shorter than is defined by the demands of measuring equipment capability; the detected measured value of the measured object is compared with an upper and lower warning threshold value; a measured value that lies within the upper and lower warning threshold value is stored and a subsequent measured value is detected using a reduced measuring time t'; if a measured value lies outside the upper and lower threshold value, the object is measured again at the same measuring point using a measuring time t and a subsequent measured value is detected using a reduced measuring time t'.</p> |
