发明名称 SEMICONDUCTOR MANUFACTURING APPARATUS AND SEMICONDUCTOR MANUFACTURING METHOD
摘要 In one embodiment, a semiconductor manufacturing apparatus includes a housing configured to house a substrate, and a first temperature regulator configured to regulate a temperature of a fluid. The apparatus further includes first and second flow channels configured to divide the fluid supplied from the first temperature regulator, and a second temperature regulator configured to regulate a temperature of the fluid in the second channel. The apparatus further includes a fluid supply channel configured to join the fluid in the first flow channel and the fluid in the second flow channel and to supply the joined fluids to the housing, and a flow rate regulator configured to regulate a flow rate of the fluid in the first flow channel and a flow rate of the fluid in the second flow channel.
申请公布号 US2016284521(A1) 申请公布日期 2016.09.29
申请号 US201514844333 申请日期 2015.09.03
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 MIYAGAWA Osamu
分类号 H01J37/32;H01L21/67 主分类号 H01J37/32
代理机构 代理人
主权项 1. A semiconductor manufacturing apparatus comprising: a housing configured to house a substrate; a first temperature regulator configured to regulate a temperature of a fluid; first and second flow channels configured to divide the fluid supplied from the first temperature regulator; a second temperature regulator configured to regulate a temperature of the fluid in the second channel; a fluid supply channel configured to join the fluid in the first flow channel and the fluid in the second flow channel and to supply the joined fluids to the housing; and a flow rate regulator configured to regulate a flow rate of the fluid in the first flow channel and a flow rate of the fluid in the second flow channel.
地址 Minato-ku JP