发明名称 METHOD FOR CALIBRATING AN OVER-THE-AIR (OTA) TEST SYSTEM FOR TESTING MULTIPLE RADIO FREQUENCY (RF) DATA PACKET SIGNAL TRANSCEIVERS
摘要 Method for calibrating an over-the air (OTA) test system for testing multiple radio frequency (RF) data packet signal transceiver devices under test (DUTs), as well as using such a calibrated OTA test system for performing such tests. Calibration is achieved by placing a known good device (KGD) in multiple defined locations within the OTA test system, radiating the KGD with RF test signals at each location, and collecting from the KGD at each location channel quality information identifying optimal RF test signal sub-band channels for ensuring reliable communications within the test system. Use of such system includes placing multiple DUTs at the defined locations within the OTA test system and communicating with them wirelessly via the identified optimal RF test signal sub-band channels.
申请公布号 US2016359718(A1) 申请公布日期 2016.12.08
申请号 US201514732236 申请日期 2015.06.05
申请人 LITEPOINT CORPORATION 发明人 BANERJEE Soumyadeep;Sheya Steve Lawrence;Yellapantula Ramakrishna
分类号 H04L12/26;H04B17/309 主分类号 H04L12/26
代理机构 代理人
主权项 1. A method for calibrating an over-the air (OTA) test system for testing a plurality of radio frequency (RF) data packet signal transceiver devices under test (DUTs), comprising: providing an OTA test environment including a structure defining interior and exterior regions and one or more RF antennas disposed to transmit and receive radiated RF signals into and from said interior region, respectively, and configured to enable placement of a plurality of DUTs at locations within said interior region substantially isolated from electromagnetic radiation originating from said exterior region; placing a known good device (KGD) in a defined location within said interior region; transmitting, into said interior region via said one or more RF antennas, a RF test signal having a RF test signal band including a plurality of RF test signal sub-band channels to convey a plurality of encoded data symbols, wherein each one of said plurality of RF test signal sub-band channels includes a plurality of serial time slots each of which contains one or more RF data signals, andrespective portions of said plurality of RF test signal sub-band channels include mutually distinct combinations of data bit modulation and quantity of data bits; receiving, with said KGD, said RF test signal and in response thereto transmitting, with said KGD, a RF DUT signal including a plurality of channel quality information (CQI) data related to said defined location for at least a portion of said plurality of RF test signal sub-band channels, wherein respective portions of said plurality of CQI data are related to respective signal-to-interference-plus-noise ratios (SINRs) for corresponding portions of said plurality of RF test signal sub-band channels; and placing said known good device (KGD) in another defined location within said interior region, followed by repeating said transmitting, into said interior region via said one or more RF antennas, a RF test signal, andreceiving, with said KGD, said RF test signal and in response thereto transmitting, with said KGD, a RF DUT signal.
地址 Sunnyvale CA US