发明名称 DITHER MASK GENERATION METHOD AND DEVICE
摘要 The dither mask generation method includes: a nozzle ejection rate determination process of determining a nozzle ejection rate of each nozzle in a recording head; a corresponding nozzle specifying process of specifying the nozzle corresponding to individual pixels of a dither mask by making at least one nozzle in charge of recording at each pixel position correspond to the individual pixels of the dither mask; a nozzle ejection rate reflecting processing process of performing processing of reflecting the nozzle ejection rate on an evaluation index when individual thresholds of the dither mask are set; and a threshold setting process of setting the thresholds to the individual pixels of the dither mask on the basis of the evaluation index.
申请公布号 US2016167376(A1) 申请公布日期 2016.06.16
申请号 US201514958376 申请日期 2015.12.03
申请人 FUJIFILM Corporation 发明人 KATSUYAMA Kimito
分类号 B41J2/045 主分类号 B41J2/045
代理机构 代理人
主权项 1. A dither mask generation method that generates a dither mask used in halftone processing, the method comprising: a nozzle ejection rate determination process of determining a nozzle ejection rate of each nozzle, that is information indicating a ratio of recording pixels for which each nozzle ejects ink to record a dot, in recording attending pixels allocated to each nozzle as pixels for which each of a plurality of nozzles in a recording head having the plurality of nozzles that eject ink is in charge of recording; a corresponding nozzle specifying process of specifying the nozzle corresponding to the individual pixels of the dither mask by making at least one nozzle in charge of recording at each pixel position correspond to the individual pixels of the dither mask; a nozzle ejection rate reflecting processing process of performing processing of reflecting the nozzle ejection rate on an evaluation index when individual thresholds of the dither mask are set; and a threshold setting process of setting the thresholds to the individual pixels of the dither mask on the basis of the evaluation index.
地址 Tokyo JP