发明名称 METAL STRAP FOR DRAM/FINFET COMBINATION
摘要 A metal strap is formed in a middle-of-line (MOL) process for communication between an eDRAM and a FinFET. An oxide is deposited in a trench over the eDRAM to prevent development of an epitaxial film prior to formation of the metal strap. The result is an epiless eDRAM strap in a FinFET.
申请公布号 US2016197083(A1) 申请公布日期 2016.07.07
申请号 US201514591065 申请日期 2015.01.07
申请人 International Business Machines Corporation 发明人 Leobandung Effendi
分类号 H01L27/108;H01L27/12 主分类号 H01L27/108
代理机构 代理人
主权项 1. A method comprising: providing a semiconductor substrate having a storage capacitor formed in a deep trench; depositing a dielectric layer into a recess adjacent to a conductive region of the storage capacitor; forming a fin of a transistor including a portion of the dielectric layer deposited into the recess; etching an opening through the dielectric layer over the conductive region; and depositing a metal layer into the opening and on the conductive region.
地址 Armonk NY US