发明名称 |
METAL STRAP FOR DRAM/FINFET COMBINATION |
摘要 |
A metal strap is formed in a middle-of-line (MOL) process for communication between an eDRAM and a FinFET. An oxide is deposited in a trench over the eDRAM to prevent development of an epitaxial film prior to formation of the metal strap. The result is an epiless eDRAM strap in a FinFET. |
申请公布号 |
US2016197083(A1) |
申请公布日期 |
2016.07.07 |
申请号 |
US201514591065 |
申请日期 |
2015.01.07 |
申请人 |
International Business Machines Corporation |
发明人 |
Leobandung Effendi |
分类号 |
H01L27/108;H01L27/12 |
主分类号 |
H01L27/108 |
代理机构 |
|
代理人 |
|
主权项 |
1. A method comprising:
providing a semiconductor substrate having a storage capacitor formed in a deep trench; depositing a dielectric layer into a recess adjacent to a conductive region of the storage capacitor; forming a fin of a transistor including a portion of the dielectric layer deposited into the recess; etching an opening through the dielectric layer over the conductive region; and depositing a metal layer into the opening and on the conductive region. |
地址 |
Armonk NY US |