发明名称 Piezoelectric thin film, piezoelectric element, and manufacturing method thereof
摘要 Provided are a piezoelectric thin film having good piezoelectricity in which a rhombohedral structure and a tetragonal structure are mixed, and a piezoelectric element using the piezoelectric thin film. The piezoelectric thin film includes a perovskite type metal oxide, in which the perovskite type metal oxide is a mixed crystal system of at least a rhombohedral structure and a tetragonal structure, and a ratio between an a-axis lattice parameter and a c-axis lattice parameter of the tetragonal structure satisfies 1.15≦c/a≦1.30. The piezoelectric element includes on a substrate: the above-mentioned piezoelectric thin film; and a pair of electrodes provided in contact with the piezoelectric thin film.
申请公布号 US9461238(B2) 申请公布日期 2016.10.04
申请号 US201113581429 申请日期 2011.02.28
申请人 CANON KABUSHIKI KAISHA;KYOTO UNIVERSITY 发明人 Kubota Makoto;Takeda Kenichi;Hayashi Jumpei;Shimada Mikio;Shimakawa Yuichi;Azuma Masaki;Nakamura Yoshitaka;Kawai Masanori
分类号 H01L41/18;H01L41/187;B41J2/14;H01L41/047;H01L41/08;H01L41/318;H02N2/10;H02N2/16;H01L41/09 主分类号 H01L41/18
代理机构 Fitzpatrick, Cella, Harper & Scinto 代理人 Fitzpatrick, Cella, Harper & Scinto
主权项 1. A piezoelectric element comprising a substrate and, on the substrate, laminated in stated order: a first electrode; a piezoelectric thin film comprising a perovskite-type metal oxide; and a second electrode, wherein the perovskite-type metal oxide has a mixed crystal system having at least a rhombohedral structure and a tetragonal structure at 25° C., wherein the perovskite-type metal oxide contains a metal oxide represented by general formula (1): Bix(M1-yCoy)O3  (1), where M represents at least one kind of metal selected from Fe and Al, and x and y satisfy 0.95≦x≦1.25 and 0.05≦y≦0.15, wherein a ratio between an a-axis lattice parameter and a c-axis lattice parameter of the tetragonal structure satisfies 1.15≦c/a≦1.30, and wherein the piezoelectric thin film is lead-free.
地址 Tokyo JP
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