发明名称 |
Solder on trace technology for interconnect attachment |
摘要 |
A solder on trace device includes a conductive trace on a semiconductor substrate surface. The conductive trace has a sidewall and a bonding surface. The solder on trace device also includes a passivation layer on at least one end of the conductive trace. The solder on trace device further includes a pre-solder material on the sidewall and the bonding surface of the conductive trace. |
申请公布号 |
US9461008(B2) |
申请公布日期 |
2016.10.04 |
申请号 |
US201313787444 |
申请日期 |
2013.03.06 |
申请人 |
QUALCOMM Incorporated |
发明人 |
Kumar Rajneesh;Bchir Omar J. |
分类号 |
H01L23/00;H01L21/48;H01L23/498;H05K3/34;H01L23/14 |
主分类号 |
H01L23/00 |
代理机构 |
|
代理人 |
Gallardo Michelle S. |
主权项 |
1. A device, comprising:
a conductive trace on a package substrate surface, the conductive trace comprising a bonding surface and a sidewall; a passivation layer on at least one end of the conductive trace; a pre-solder material for forming a wetting surface on the sidewall and the bonding surface of the conductive trace; and a solder material coupled to the pre-solder material, wherein the solder material is distinct from the pre-solder material, and wherein a combination of the pre-solder material and the solder material forms a non-uniform solder material. |
地址 |
San Diego CA US |