| 摘要 |
PROBLEM TO BE SOLVED: To provide an analysis method which repairs and analyzes defective memories in a short time, and also provide a memory-testing device which mounts a defect repair/analysis device adopting the analysis method. SOLUTION: The memory-testing device is equipped with a defect repair/analysis device which tests memories to be tested equipped with a plurality of storage areas, counts the number of defective cells for each storage area, reads out the number of the total defective cells, and executes defect repair and analysis. In this case, the memory-testing device is provided with: a target area searching means which determines whether to analyze the storage areas depending on defective cells in each storage area; a defective line searching means which detects defective cells on the row addresses of the storage areas to be analyzed; and an address scanning means which scans the orthogonal column addresses, when the defective line searching means detects defective cells, and detects the column addresses of the defective cells. COPYRIGHT: (C)2009,JPO&INPIT
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