发明名称 Transistor layout for standard cell with optimized mechanical stress effect
摘要 A layout for a transistor in a standard cell is disclosed. The layout for a transistor comprises an active region with at least one portion having a first edge and at least one portion having a second edge all perpendicular to a channel of the transistor; and a gate placed on top of the active region with a distance from an edge of the gate to the first edge being shorter than a distance from the edge of the gate to the second edge of the active region, wherein the active region is of a non-rectangular shape.
申请公布号 US2007284618(A1) 申请公布日期 2007.12.13
申请号 US20060441557 申请日期 2006.05.26
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. 发明人 CHANG MI-CHANG;HAN LIANG-KAI;HUANG HUAN-TSUNG;LIANG WEN-JYA;TIEN LI-CHUN
分类号 H01L27/10;H01L29/739 主分类号 H01L27/10
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