| 摘要 |
A phase contrast electron microscope has an objective ( 8 ) with a back focal plane ( 10 ), a first diffraction lens ( 11 ), which images the back focal plane ( 10 ) of the objective ( 8 ) magnified into a diffraction intermediate image plane, a second diffraction lens ( 15 ) whose principal plane is mounted in the proximity of the diffraction intermediate image plane and a phase-shifting element ( 16 ) which is mounted in or in the proximity of the diffraction intermediate image plane. Also, a phase contrast electron microscope has an objective ( 8 ) having a back focal plane ( 10 ), a first diffraction lens ( 11 ), a first phase-shifting element and a second phase-shifting element which is mounted in or in the proximity of the diffraction intermediate image plane. The first diffraction lens ( 11 ) images the back focal plane of the objective magnified into a diffraction intermediate image plane and the first phase-shifting element is mounted in the back focal plane ( 10 ) of the objective ( 8 ). With the magnified imaging of the diffraction plane by the diffraction lens, the dimensional requirements imposed on the phase plate having the phase-shifting element are reduced.
|
