发明名称 |
Phase Plate, Method of Fabricating Same, and Electron Microscope |
摘要 |
A phase plate capable of suppressing electrification and a method of fabricating the plate are provided. The phase plate is for use in an electron microscope and includes a phase control layer provided with a through-hole and at least one conductive layer covering and closing off the through-hole. The conductive layer is formed on at least one of a first surface and a second surface of the phase control layer, the second surface being on the opposite side of the first surface. The phase control layer produces a given phase difference between electron waves transmitted through the phase control layer and electron waves transmitted through the through-hole. |
申请公布号 |
US2016276125(A1) |
申请公布日期 |
2016.09.22 |
申请号 |
US201615067394 |
申请日期 |
2016.03.11 |
申请人 |
JEOL Ltd. |
发明人 |
Iijima Hirofumi |
分类号 |
H01J37/147;H01J37/26 |
主分类号 |
H01J37/147 |
代理机构 |
|
代理人 |
|
主权项 |
1. A phase plate for use in an electron microscope, said phase plate comprising:
a phase control layer provided with a through-hole and having a first surface and a second surface on the opposite side of the first surface; and at least one electrically conductive layer formed on at least one of the first and second surfaces of the phase control layer and covering and closing off the through-hole; wherein the phase control layer produces a given phase difference between electron waves transmitted through the phase control layer and electron waves transmitted through the through-hole. |
地址 |
Tokyo JP |