发明名称 試験装置
摘要 PROBLEM TO BE SOLVED: To provide a test device capable of interrupting a power supply connected to the same device to be tested with simple configurations.SOLUTION: The test device includes: a plurality of power supply units for supplying a power to the same device to be tested, that is, a plurality of power supply units each including an output circuit for outputting an error signal when abnormality is generated in its own power supply unit and an interruption circuit connected to the output circuit by wiring for interrupting the power supply of its own power supply unit when receiving the error signal; and wiring for connecting the wiring for connecting the output circuit to the interruption circuit between the plurality of power supply units.
申请公布号 JP6044297(B2) 申请公布日期 2016.12.14
申请号 JP20120255413 申请日期 2012.11.21
申请人 富士通株式会社 发明人 上坂 光司
分类号 G01R31/28 主分类号 G01R31/28
代理机构 代理人
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