摘要 |
PROBLEM TO BE SOLVED: To provide a test device capable of interrupting a power supply connected to the same device to be tested with simple configurations.SOLUTION: The test device includes: a plurality of power supply units for supplying a power to the same device to be tested, that is, a plurality of power supply units each including an output circuit for outputting an error signal when abnormality is generated in its own power supply unit and an interruption circuit connected to the output circuit by wiring for interrupting the power supply of its own power supply unit when receiving the error signal; and wiring for connecting the wiring for connecting the output circuit to the interruption circuit between the plurality of power supply units. |