| 摘要 |
PROBLEM TO BE SOLVED: To provide a test device capable of testing a digital filter easily and sufficiently by simple constitution, without increasing the number of test data. SOLUTION: A closed loop is formed to supply an output data of the digital filter 1 to an input side by multiplexers 2, 3 of the test device, a controller 8 sets the test data in the input side of the digital filter 1 under the condition where the closed loop is formed, and arithmetic processing is executed to carry out a functional test automatically. COPYRIGHT: (C)2005,JPO&NCIPI
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