发明名称 Line testing apparatus and method
摘要 The line test apparatus includes a PC ( 5 ) which stores known line test signature parameters for a number of known fault conditions in which by application of varying signals to a line pair ( 2,3 ) under test and capturing parameters during a period in which varying signals are applied to the line via a test head ( 1 ), an estimate of the state of the line can be made. A remote unit ( 6 ) located at a switch or exchange may also be used to complete the automated scanning of parameters of a line in response to various electrical stimuli. The invention is particularly effective at determining faults which are "dynamic" as well as those which are permanent until repaired.
申请公布号 US2006193444(A1) 申请公布日期 2006.08.31
申请号 US20050550206 申请日期 2005.09.21
申请人 AUFENAST DAVID;FLETCHER MARK A;HOY MICHAEL D 发明人 AUFENAST DAVID;FLETCHER MARK A.;HOY MICHAEL D.
分类号 H04M1/24;H04M3/08;H04M3/24;H04M3/30 主分类号 H04M1/24
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