发明名称 |
MASKS, METHOD TO INSPECT AND ADJUST MASK POSITION, AND METHOD TO PATTERN PIXELS OF ORGANIC LIGHT-EMITTING DISPLAY DEVICE UTILIZING THE MASKS |
摘要 |
A method for pixel patterning and pixel position inspection of an organic light-emitting display device includes: forming, on a substrate using a first mask, a thin film layer of a first color corresponding to a first pixel pattern and a first pixel positioning pattern for inspecting a position of a first pixel; shifting, by a determined pitch, the first mask from a position associated with forming the thin film layer of the first color; aligning the shifted first mask with respect to the substrate; and forming, on the substrate using the shifted first mask, a thin film layer of a second color corresponding to the first pixel pattern and another first pixel positioning pattern for inspecting a position of a second pixel. |
申请公布号 |
US2016343944(A1) |
申请公布日期 |
2016.11.24 |
申请号 |
US201514883989 |
申请日期 |
2015.10.15 |
申请人 |
Samsung Display Co., Ltd. |
发明人 |
LEE Sangshin;HA Dongjin;KANG Mingoo;KWON Ohseob;YI Sangmin |
分类号 |
H01L51/00;H01L27/32;H01L51/56 |
主分类号 |
H01L51/00 |
代理机构 |
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代理人 |
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主权项 |
1. A method for pixel patterning and pixel position inspection of an organic light-emitting display device, the method comprising:
forming, on a substrate using a first mask, a thin film layer of a first color corresponding to a first pixel pattern and a first pixel positioning pattern for inspecting a position of a first pixel; shifting, by a determined pitch, the first mask from a position associated with forming the thin film layer of the first color; aligning the shifted first mask with respect to the substrate; and forming, on the substrate using the shifted first mask, a thin film layer of a second color corresponding to the first pixel pattern and another first pixel positioning pattern for inspecting a position of a second pixel. |
地址 |
Yongin-si KR |