发明名称 Method of forming phase change memory devices in a pulsed DC deposition chamber
摘要 A phase change memory (530) including an ovonic threshold switch (122) is formed using a pulsed DC deposition chamber (12) using pulsed DC. Pulsed DC is used to deposit a chalcogenide film (132). Pulsed DC may be also used to deposit a carbon film (118, 120, 124).
申请公布号 EP1912266(A1) 申请公布日期 2008.04.16
申请号 EP20060425696 申请日期 2006.10.10
申请人 STMICROELECTRONICS S.R.L. 发明人 HAMAMJY, ROGER;CHANG, KUO-WEI;LEE, SEAN JONG;LIM, CHONG W.
分类号 H01L45/00;C23C14/06 主分类号 H01L45/00
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