| 摘要 |
The present invention relates to a test handler to assist a test of a semiconductor device. The test handler of the present invention comprises: a rail unit to guide the movement of a test tray when the test tray moves to a test position and to support the test tray in the test position. The rail unit comprises: a guide rail having an inserting groove into which one end of the test tray is inserted to guide the movement of the test tray; an advancing/retreating member placed to support one end of the test tray inserted into the inserting groove and to advance and retreat; and an elastic member to elastically support the advancing/retreating member toward an interface board of a tester. According to the present invention, the test handler is able to prevent the bending deflection of the test tray and the damage to an insert. |
