发明名称 Brown-Out Detector
摘要 Various implementations described herein are directed to an integrated circuit for brown-out detection. The integrated circuit may include a first stage configured to receive an input voltage and provide a first voltage independent of temperature while remaining related to the input voltage. The integrated circuit may include a second stage configured to receive the input voltage, receive the first voltage from the first stage, and up-convert the first voltage as input voltage lowers. The second stage may be configured to provide a second voltage corresponding to a differential voltage of the input voltage and the first voltage. The integrated circuit may include a third stage configured to receive the second voltage and provide a high-gain output voltage corresponding to an error signal.
申请公布号 US2016334470(A1) 申请公布日期 2016.11.17
申请号 US201514712614 申请日期 2015.05.14
申请人 ARM Limited 发明人 Sandhu Bal S.;Myers James Edward
分类号 G01R31/40;G01R19/165;G01R19/32;G01R17/00 主分类号 G01R31/40
代理机构 代理人
主权项 1. An integrated circuit, comprising: a first stage having first transistors and resistors arranged to receive an input voltage and provide a first voltage that is substantially independent of temperature while remaining related to the input voltage; a second stage having second transistors arranged to receive the input voltage and receive the first voltage from the first stage and up-convert the first voltage as the input voltage lowers, wherein the second stage is configured to provide a second voltage corresponding to a differential voltage of the input voltage and the first voltage; and a third stage having third transistors arranged to receive the second voltage and provide a high-gain output voltage corresponding to an error signal.
地址 Cambridge GB