发明名称 |
Brown-Out Detector |
摘要 |
Various implementations described herein are directed to an integrated circuit for brown-out detection. The integrated circuit may include a first stage configured to receive an input voltage and provide a first voltage independent of temperature while remaining related to the input voltage. The integrated circuit may include a second stage configured to receive the input voltage, receive the first voltage from the first stage, and up-convert the first voltage as input voltage lowers. The second stage may be configured to provide a second voltage corresponding to a differential voltage of the input voltage and the first voltage. The integrated circuit may include a third stage configured to receive the second voltage and provide a high-gain output voltage corresponding to an error signal. |
申请公布号 |
US2016334470(A1) |
申请公布日期 |
2016.11.17 |
申请号 |
US201514712614 |
申请日期 |
2015.05.14 |
申请人 |
ARM Limited |
发明人 |
Sandhu Bal S.;Myers James Edward |
分类号 |
G01R31/40;G01R19/165;G01R19/32;G01R17/00 |
主分类号 |
G01R31/40 |
代理机构 |
|
代理人 |
|
主权项 |
1. An integrated circuit, comprising:
a first stage having first transistors and resistors arranged to receive an input voltage and provide a first voltage that is substantially independent of temperature while remaining related to the input voltage; a second stage having second transistors arranged to receive the input voltage and receive the first voltage from the first stage and up-convert the first voltage as the input voltage lowers, wherein the second stage is configured to provide a second voltage corresponding to a differential voltage of the input voltage and the first voltage; and a third stage having third transistors arranged to receive the second voltage and provide a high-gain output voltage corresponding to an error signal. |
地址 |
Cambridge GB |