| 摘要 |
A substrate test apparatus for a flat panel display device is provided to adjust a location of the substrate test apparatus finely for testing unique codes of a plurality of substrates by using X-axis, Y-axis and Z-axis micrometers. A first alignment part(220) is installed perpendicularly to a transfer part(210). A second alignment part(230) is connected perpendicularly to the first alignment part. A code reader(250) is installed to face one set of surfaces of a plurality of substrates where unique codes are respectively provided. A third alignment part(240) connects the second alignment part with the code reader. An X-axis micrometer(260) and a Y-axis micrometer are installed between the first alignment part and the second alignment part in an X-direction and a Y-direction, respectively, and set Z-axis coordinates of the code reader. |
