MEASUREMENT APPARATUS

摘要

The present invention provides a measurement apparatus which measures a shape of a target object, the apparatus including a projection unit configured to project, on the target object, line pattern light including a plurality of lines formed from light having a first wavelength and identification pattern light formed from light having a second wavelength different from the first wavelength and including an identification pattern of a plurality of dots for respectively identifying the plurality of lines, and an image sensing unit configured to obtain a first image corresponding to the line pattern light and a second image corresponding to the identification pattern light by separating the line pattern light and the identification pattern light projected on the target object based on wavelengths and sensing the line pattern light and the identification pattern light.

主权项

1. A measurement apparatus which measures a shape of a target object, the apparatus comprising:
a projection unit configured to project, on the target object, line pattern light including a plurality of lines formed from light having a first wavelength and identification pattern light formed from light having a second wavelength different from the first wavelength and including an identification pattern of a plurality of dots for respectively identifying the plurality of lines; an image sensing unit configured to obtain a first image corresponding to the line pattern light and a second image corresponding to the identification pattern light by separating the line pattern light and the identification pattern light projected on the target object based on wavelengths and sensing the line pattern light and the identification pattern light; and a processing unit configured to obtain information of a shape of the target object based on the first image and the second image.