发明名称 INTEGRATED CIRCUIT DEVICE COMPRISING ENVIRONMENT-HARDENED DIE AND LESS-ENVIRONMENT-HARDENED DIE
摘要 An integrated circuit device has at least one environment-hardened die and at least one less-environment-hardened die. Environment-hardened circuitry on the environment-hardened die is more resistant to the degradation when exposed to a predetermined environmental condition than the less-environment-hardened circuitry on the environment-hardened die. The dice are combined using a 3D or 2.5D integrated circuit technology. This is very useful for testing circuits at adverse environmental conditions (e.g. high temperature), or for providing circuits to operate at such conditions.
申请公布号 US2016161550(A1) 申请公布日期 2016.06.09
申请号 US201414560755 申请日期 2014.12.04
申请人 ARM Limited 发明人 YERIC Gregory Munson;CHANDRA Vikas
分类号 G01R31/28;H01L25/065;H01L21/66 主分类号 G01R31/28
代理机构 代理人
主权项 1. An integrated circuit device comprising: at least one environment-hardened die comprising environment-hardened circuitry; and at least one less-environment-hardened die comprising less-environment-hardened circuitry, wherein the environment-hardened circuitry is more resistant to degradation when exposed to at least one predetermined environmental condition than the less-environment-hardened circuitry; wherein:(i) the integrated circuit device comprises a plurality of vertically stacked dice including the at least one environment-hardened die and the at least one less-environment-hardened die; or(ii) the at least one environment-hardened die and the at least one less-environment-hardened die are mounted on an interposer to provide communication between the at least one environment-hardened die and the at least one less-environment-hardened die.
地址 Cambridge GB