发明名称 HIGH ENERGY GRATING TECHNIQUES
摘要 Imaging techniques that may be used in applications such as differential phase contrast imaging are disclosed that include, for example, configuring a beam source and a beam detector such that a beam connects the two, positioning an object, a phase grating and an analyzer grating in the beam path, producing multiple data sets based on various analyzer grating positions, and conducting a regression analysis using a predetermined function having a set of fitting coefficients to establish those fitting coefficients. In those techniques, the fitting coefficients may be used to characterize a set of interference properties associated with the object.
申请公布号 US2016161427(A1) 申请公布日期 2016.06.09
申请号 US201514958882 申请日期 2015.12.03
申请人 Board of Supervisors of Louisiana State University and Agricultural and Mechanical College 发明人 Butler Leslie G.;Ham Kyungmin;Johnson Warren W.
分类号 G01N23/20;G01N23/05;A61B6/00;G01N23/04 主分类号 G01N23/20
代理机构 代理人
主权项 1. An imaging technique comprising: a. providing a beam source; b. providing a beam detector; c. configuring the beam source and the beam detector such that a beam path connects the beam source and the beam detector; d. positioning an object in the beam path; e. positioning a phase grating in the beam path; f. positioning an analyzer grating in a first position in the beam path; g. projecting a first beam along the beam path thereby producing a first data set; h. moving the analyzer grating from the first position to a second position; i. projecting a second beam along the beam path thereby producing a second data set; j. moving the analyzer grating from the second position to a third position; k. projecting a third beam along the beam path thereby producing a third data set; l. conducting a regression analysis fitting pixel data from a group of data sets comprising the first data set, the second data set and the third data set to a predetermined function to establish a set of fitting coefficients; m. wherein the fitting coefficients characterize a set of interference properties associated with the object; n. wherein the predetermined function is dependent on the analyzer grating position; and o. wherein the predetermined function contains sinusoidal functions.
地址 Baton Rouge LA US