发明名称 |
HIGH ENERGY GRATING TECHNIQUES |
摘要 |
Imaging techniques that may be used in applications such as differential phase contrast imaging are disclosed that include, for example, configuring a beam source and a beam detector such that a beam connects the two, positioning an object, a phase grating and an analyzer grating in the beam path, producing multiple data sets based on various analyzer grating positions, and conducting a regression analysis using a predetermined function having a set of fitting coefficients to establish those fitting coefficients. In those techniques, the fitting coefficients may be used to characterize a set of interference properties associated with the object. |
申请公布号 |
US2016161427(A1) |
申请公布日期 |
2016.06.09 |
申请号 |
US201514958882 |
申请日期 |
2015.12.03 |
申请人 |
Board of Supervisors of Louisiana State University and Agricultural and Mechanical College |
发明人 |
Butler Leslie G.;Ham Kyungmin;Johnson Warren W. |
分类号 |
G01N23/20;G01N23/05;A61B6/00;G01N23/04 |
主分类号 |
G01N23/20 |
代理机构 |
|
代理人 |
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主权项 |
1. An imaging technique comprising:
a. providing a beam source; b. providing a beam detector; c. configuring the beam source and the beam detector such that a beam path connects the beam source and the beam detector; d. positioning an object in the beam path; e. positioning a phase grating in the beam path; f. positioning an analyzer grating in a first position in the beam path; g. projecting a first beam along the beam path thereby producing a first data set; h. moving the analyzer grating from the first position to a second position; i. projecting a second beam along the beam path thereby producing a second data set; j. moving the analyzer grating from the second position to a third position; k. projecting a third beam along the beam path thereby producing a third data set; l. conducting a regression analysis fitting pixel data from a group of data sets comprising the first data set, the second data set and the third data set to a predetermined function to establish a set of fitting coefficients; m. wherein the fitting coefficients characterize a set of interference properties associated with the object; n. wherein the predetermined function is dependent on the analyzer grating position; and o. wherein the predetermined function contains sinusoidal functions. |
地址 |
Baton Rouge LA US |