| 主权项 |
1. A testing system for testing a light-emitting device comprising a plurality of discrete light-emitting elements disposed over a substrate, the testing system comprising:
a power source for energizing at least some of the discrete light-emitting elements; an imaging system for acquiring at least one image of all of the energized light-emitting elements within a field of view of the imaging system during energization of the light-emitting elements; and an analyzer for determining, from the at least one image, an optical characteristic of one or more of the imaged light-emitting elements, wherein (i) the optical characteristic comprises at least one of radiant flux, luminous flux, one or more tristimulus color values, chromaticity coordinates, peak wavelength, dominant wavelength, correlated color temperature, color rendering index, or R9 and (ii) the analyzer is configured to, from the at least one image, determine locations of non-functional light-emitting elements. |
