发明名称 |
SAMPLE MEASURING DEVICE |
摘要 |
Each adapter disposed on a rack includes a pair of arms that configure an opening/closing mechanism. During rack conveyance, a guiding block is slotted between a pair of legs contained in the rack. The opening/closing mechanism being abutted against the guiding block causes the opening/closing mechanism to perform an opening/closing operation. When the state of the opening/closing mechanism is changed from closed to open, a pre-measurement sample container is passed from a sample storage unit to a lifting mechanism. Subsequent to the post-measurement sample container being returned to the sample storage unit, the state of the opening/closing mechanism is changed from open to closed. |
申请公布号 |
US2016252634(A1) |
申请公布日期 |
2016.09.01 |
申请号 |
US201415028157 |
申请日期 |
2014.09.30 |
申请人 |
HITACHI, LTD. |
发明人 |
HANAYA Tomonori;AKUTA Yujiro |
分类号 |
G01T7/08;G01N35/04;G01T1/204 |
主分类号 |
G01T7/08 |
代理机构 |
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代理人 |
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主权项 |
1. A sample measurement device, comprising:
a rack that has a longitudinal direction and a short-side direction orthogonal to the longitudinal direction, that has a pair of legs distanced from each other in the short-side direction, and that has a sample storage unit having an open/close mechanism including a pair of contact members; a rack-transporting mechanism that transports the rack on a transport surface; a guide block provided on the transport surface that enters a lower part of the rack during transport of the rack, and that has a lower layer that enters a region between the pair of the legs for centering the rack in the short-side direction and an upper layer that is a layer above the lower layer and that enters a region between the pair of the contact members to set the open/close mechanism to an open state; and a lifting/lowering mechanism that transports a sample container between the sample storage unit and a sample measurement chamber provided below the transport surface in an open state of the open/close mechanism. |
地址 |
Tokyo JP |