发明名称 SAMPLE MEASURING DEVICE
摘要 Each adapter disposed on a rack includes a pair of arms that configure an opening/closing mechanism. During rack conveyance, a guiding block is slotted between a pair of legs contained in the rack. The opening/closing mechanism being abutted against the guiding block causes the opening/closing mechanism to perform an opening/closing operation. When the state of the opening/closing mechanism is changed from closed to open, a pre-measurement sample container is passed from a sample storage unit to a lifting mechanism. Subsequent to the post-measurement sample container being returned to the sample storage unit, the state of the opening/closing mechanism is changed from open to closed.
申请公布号 US2016252634(A1) 申请公布日期 2016.09.01
申请号 US201415028157 申请日期 2014.09.30
申请人 HITACHI, LTD. 发明人 HANAYA Tomonori;AKUTA Yujiro
分类号 G01T7/08;G01N35/04;G01T1/204 主分类号 G01T7/08
代理机构 代理人
主权项 1. A sample measurement device, comprising: a rack that has a longitudinal direction and a short-side direction orthogonal to the longitudinal direction, that has a pair of legs distanced from each other in the short-side direction, and that has a sample storage unit having an open/close mechanism including a pair of contact members; a rack-transporting mechanism that transports the rack on a transport surface; a guide block provided on the transport surface that enters a lower part of the rack during transport of the rack, and that has a lower layer that enters a region between the pair of the legs for centering the rack in the short-side direction and an upper layer that is a layer above the lower layer and that enters a region between the pair of the contact members to set the open/close mechanism to an open state; and a lifting/lowering mechanism that transports a sample container between the sample storage unit and a sample measurement chamber provided below the transport surface in an open state of the open/close mechanism.
地址 Tokyo JP