发明名称 METHOD AND DEVICE FOR MEASURING WHETHER A PROCESS KIT PART MEETS A PRESCRIBED TOLERANCE
摘要 A go no-go gauge and method for verifying whether a process kit part used within a plasma chamber of a plasma processing tool has accumulated excessive wear or deposits. The gauge includes a component for verifying whether a dimension of a process kit part feature violates a prescribed size tolerance, the violation indicating that the process kit part has accumulated excessive wear or deposits. ® KIPO & WIPO 2007
申请公布号 KR20070001075(A) 申请公布日期 2007.01.03
申请号 KR20067011527 申请日期 2006.06.12
申请人 TOKYO ELECTRON LIMITED 发明人 FINK STEVEN T.
分类号 G01B3/00;G01B3/50;G01M99/00 主分类号 G01B3/00
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