System for the detection of the illumination intensity in a laser scanning microscope

摘要

Part of illumination beams (MD1-MD3) is decoupled and detected on a principal-color splitter (HFT). Part of illumination beams can be decoupled and detected before bunching into fiber optical wave-guides (F1,F2). Part of the illumination beams can also be decoupled and detected on a beam-slitter (ST2) subordinate to the fiber optical wave-guides. An independent claim is also included for a method for operating a laser-scanning microscope.