发明名称 |
OPTICAL AXIS INSPECTION METHOD AND OPTICAL AXIS INSPECTION APPARATUS |
摘要 |
An optical axis inspection apparatus is provided with: a camera for capturing a light distribution pattern of a light source device projected on a screen; an image processing device for finding a cutoff line in the light distribution pattern; an acceptance reference cutoff line setting unit; and a shade having an oblong slit and arranged to be opposed to a projection lens of the projection type light source device. Whether or not an optical axis is proper is inspected based oh a shift of the cutoff line with respect to the acceptance reference cutoff line. Only a transmissive light passing through a substantially central portion in a vertical direction of a projection lens including an optical axis of the projection lens is guided onto the screen by the shade.
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申请公布号 |
US2009073703(A1) |
申请公布日期 |
2009.03.19 |
申请号 |
US20080208982 |
申请日期 |
2008.09.11 |
申请人 |
KOITO MANUFACTURING CO., LTD. |
发明人 |
INABA TETSUAKI |
分类号 |
G01B9/00 |
主分类号 |
G01B9/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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