MICROSCOPE DETECT APPARATUS AND METHOD USED X-RAY HOLOGRAPHY

摘要

Disclosed are a microscope measuring device and a method using X-ray holography for a large-area sample. The disclosed invention comprises the steps of: acquiring a holographic diffraction image for acquiring an autocorrelation signal of a sample without a reference; acquiring a hologram image by adding a reference to the sample; Fourier transforming two holograms and comparing the images; and restoring a hidden sample image through a difference between the two images.