| 发明名称 | Fault isolation by counting abnormalities | ||
| 摘要 | An information processing device includes a plurality of components and a processor. The processor is configured to measure, upon detection of abnormalities in first components among the plurality of components, a number of abnormalities that occur in each of the first components. The processor is configured to measure an access processing value in each of the first components. The access processing value represents an amount of a predetermined feature relating to each of the first components. The processor is configured to calculate a ratio of the number of abnormalities to the access processing value in each of the first components. The processor is configured to identify a component as a fault location based on the calculated ratios. | ||
| 申请公布号 | US9459943(B2) | 申请公布日期 | 2016.10.04 |
| 申请号 | US201414256077 | 申请日期 | 2014.04.18 |
| 申请人 | FUJITSU LIMITED | 发明人 | Sampei Akira;Hanzawa Fumio;Sato Hiroaki;Harada Tsunemichi |
| 分类号 | G06F11/00;G06F11/07 | 主分类号 | G06F11/00 |
| 代理机构 | Staas & Halsey LLP | 代理人 | Staas & Halsey LLP |
| 主权项 | 1. An information processing device comprising: a plurality of components; and a processor configured to: measure, upon detection of abnormalities in first components among the plurality of components, a number of abnormalities that occur in the respective first components,measure an access processing value in the respective first components, the access processing value representing an amount of a predetermined feature relating to the respective first components,calculate a ratio of the number of abnormalities to the access processing value in the respective first components,calculate, when the number of abnormalities in each of second components among the first components has reached a threshold, the ratio for each of the second components; andidentify a component as a fault location based on the calculated ratios. | ||
| 地址 | Kawasaki JP | ||