发明名称 SYSTEM FOR ANALYZING GAS UNDER REDUCED PRESSURE
摘要 <p><P>PROBLEM TO BE SOLVED: To realize high sensitivity and high accuracy analysis under optimum measurement environmental pressure, regardless of the pressure conditions of a manufacturing process, while preventing cost from increasing by using the minimum amount of equipment, and to improve the analyzer itself in durability. <P>SOLUTION: In a gas analyzing system, a vacuum pump 3 interposed in an evacuation system 2 which sucks and exhausts process gas obtained after the manufacturing process under a reduced pressure, is constituted of two or more stages of roots pumps 3A-3E which are arranged serially in a gas evacuation direction and comparted by partitions 9 of respective compression chambers 6. The gas-analyzing system is constituted up such that a component of the gas is measured by an infrared gas analyzer 4, capable of being selectively connected to any one of exhaust ports of the compression chambers 6 in the two or more stages of roots pumps 3A-3E. <P>COPYRIGHT: (C)2007,JPO&INPIT</p>
申请公布号 JP2006343262(A) 申请公布日期 2006.12.21
申请号 JP20050170581 申请日期 2005.06.10
申请人 HORIBA STEC CO LTD 发明人 IKEDA TORU
分类号 G01N21/61;G01N1/00;G01N21/35;G01N21/3504 主分类号 G01N21/61
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