发明名称 Measuring device for mapping object area with terahertz radiation, has reference object arranged in object area, in which reference object is radiated by reference radiation
摘要 <p>The measuring device (1) has a reference object (4) arranged in an object area (2), in which the reference object is radiated by a reference radiation. A terahertz receiver unit (8) is provided with multiple terahertz detector unit. A deformation mirror (6) is provided, which has actuators (13). The deformation mirror receives terahertz radiation from the object area and reference radiation coming from the reference object and reflects into a light path guided by terahertz receiver unit. An independent claim is a measurement assembly comprises multiple measuring devices.</p>
申请公布号 DE102007011704(A1) 申请公布日期 2008.09.11
申请号 DE20071011704 申请日期 2007.03.08
申请人 GENESIS ADAPTIVE SYSTEME DEUTSCHLAND GMBH 发明人 MOELLER, TIMO;HAUSNER, FRANZ;BROCK, AXEL;BEIGANG, RENE;JONUSCHEIT, JOACHIM
分类号 G01V3/12;G03B42/00 主分类号 G01V3/12
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