发明名称 Semiconductor device and method for manufacturing same
摘要 The short circuit between the bit line and thee cell contact can be prevented without considerably increasing the number of the manufacturing processes. The bit line 6 electrically coupled to the cell contact 9 is formed of the material, which is same as the material of cell contact 9. In the process for forming the bit line 6 on the cell contact interlayer film 8 by etching, the etching for creating an upper surface of the cell contact 9 that is not coupled to the bit line 6 being lower than an upper surface of the cell contact 9 that is coupled to the bit line 6. Further, after the formation of the bit line 6, the barrier metal layer 5 formed on the lower surface of the bit line 6 is selectively etched.
申请公布号 US2005040449(A1) 申请公布日期 2005.02.24
申请号 US20040920176 申请日期 2004.08.18
申请人 NEC ELECTRONICS CORPORATION 发明人 INOUE TOMOKO;INOUE KEN
分类号 H01L21/768;H01L21/8242;H01L27/108;(IPC1-7):H01L27/108 主分类号 H01L21/768
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