发明名称 HOTWALL REACTOR AND METHOD FOR REDUCING PARTICLE FORMATION IN GAN MOCVD
摘要 Systems and methods to suppress the formation of parasitic particles during the deposition of a III- V nitride film with, e.g., metal-organic chemical vapor deposition (MOCVD) are described. In accordance with certain aspects of the invention, a hotwall reactor design and methods associated therewith, with wall temperatures similar to process temperatures, so as to create a substantially isothermal reaction chamber, may generally suppress parasitic particle formation and improve deposition performance.
申请公布号 WO2008024932(A3) 申请公布日期 2008.04.17
申请号 WO2007US76678 申请日期 2007.08.23
申请人 APPLIED MATERIALS, INC.;BOUR, DAVID;SMITH, JACOB;NIJHAWAN, SANDEEP;WASHINGTON, LORI 发明人 BOUR, DAVID;SMITH, JACOB;NIJHAWAN, SANDEEP;WASHINGTON, LORI
分类号 H01L21/336;H01L51/40 主分类号 H01L21/336
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