| 摘要 |
Test equipment for testing variation in power supply voltage supplied to a device under test comprising a power supply section for supplying a power supply voltage to the power supply input terminal of the device under test, an oscillator outputting a clock signal having a frequency corresponding to a power supply voltage supplied to the power supply input terminal of the device under test, and a measuring section for measuring the frequency of the clock signal. The oscillator delivers the output signal from any one of an odd number of negation logic elements connected in loop as the clock signal, wherein the negation logic element operates as the voltage source of a voltage corresponding to a power supply voltage supplied to the power supply input terminal of the device under test.
|
