发明名称 |
APPARATUS FOR FORMING A THIN LAYER AND METHOD OF FORMING A THIN LAYER ON A SUBSTRATE USNIG THE SAME |
摘要 |
An apparatus and method of forming an epitaxial layer are provided. The apparatus includes a process chamber in which an epitaxial process is performed to form epitaxial layer on a substrate. A first supplier supplies source gases for the epitaxial layer into the process chamber. A second supplier supplies dopants into the process chamber. A detector detects a composition ratio of the epitaxial layer and a concentration of the dopants in the epitaxial layer during the epitaxial growth process. And a controller controls a mass flow of at least one of the source gases and a mass flow of the dopants in-line with the epitaxial growth process. Accordingly, the layer thickness of the epitaxial layer can be accurately controlled in real time in line with the epitaxial process. |
申请公布号 |
US2016181167(A1) |
申请公布日期 |
2016.06.23 |
申请号 |
US201514975706 |
申请日期 |
2015.12.18 |
申请人 |
Samsung Electronics Co., Ltd. |
发明人 |
KIM Min-Kook;KIM Bang-Won;YANG Yu-Sin;YOON Young-Jee;LEE Sang-Kil;JANG Yoo-Seok;JUN Chung-Sam |
分类号 |
H01L21/66;H01L21/67;C30B29/10;H01L29/207;C30B25/16;C30B29/40;H01L21/02;H01L29/167 |
主分类号 |
H01L21/66 |
代理机构 |
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代理人 |
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主权项 |
1. An apparatus for performing an epitaxial process, comprising:
a process chamber in which an epitaxial layer is formed on a substrate using an epitaxial process; a first supplier that supplies source gases for the epitaxial layer into the process chamber during the epitaxial process; a second supplier that supplies dopants into the process chamber during the epitaxial process; a detector that detects a composition ratio of the epitaxial layer and a concentration of the dopants in the epitaxial layer during the epitaxial process; and a controller that controls a mass flow of the source gases, a mass flow of the dopants, or both, in-line with the epitaxial process. |
地址 |
Suwon-si KR |