| 摘要 |
According to an embodiment, an operation method for a memory device which has a first memory element and a second memory element respectively provided on both sides of a semiconductor member includes applying a first voltage to a second word line, the first voltage being negative for a voltage of a cell source line, and applying a second voltage to a first word line, the second voltage being positive for the voltage of the cell source line when reading out a data from the first memory element. |
