发明名称 METHOD FOR ACQUIRING REFERENCE POSITION, DEVICE FOR ACQUIRING REFERENCE POSITION, PATTERN DRAWING METHOD, PATTERN DRAWING DEVICE AND PROGRAM
摘要 PROBLEM TO BE SOLVED: To easily acquire a plurality of reference position and a plurality of corresponding reference position images for detecting stain of a circuit board from an engineering pattern.SOLUTION: A first shape symmetric to an axis parallel to a first direction is acquired from each of a plurality of noticed images extracted from an engineering pattern which is a pattern on engineering (Step S22). A first total length which is sum of lengths of the first shape in the first direction is acquired (Step S23). Same treatment is conducted on a second direction vertical to the first direction and a second total length is acquired (Step S24, S25). A score showing degree of suitability of the noticed images to a reference position image is acquired from the first total length and the second total length (Step S26). A plurality of corresponding reference position images are acquired by determining a plurality of reference positions based on the score.SELECTED DRAWING: Figure 5A
申请公布号 JP2016191907(A) 申请公布日期 2016.11.10
申请号 JP20160021581 申请日期 2016.02.08
申请人 SCREEN HOLDINGS CO LTD 发明人 TANIGUCHI KAZUTAKA;NAKANISHI KENJI
分类号 G03F9/00;H05K3/00 主分类号 G03F9/00
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