发明名称 |
METHOD FOR ACQUIRING REFERENCE POSITION, DEVICE FOR ACQUIRING REFERENCE POSITION, PATTERN DRAWING METHOD, PATTERN DRAWING DEVICE AND PROGRAM |
摘要 |
PROBLEM TO BE SOLVED: To easily acquire a plurality of reference position and a plurality of corresponding reference position images for detecting stain of a circuit board from an engineering pattern.SOLUTION: A first shape symmetric to an axis parallel to a first direction is acquired from each of a plurality of noticed images extracted from an engineering pattern which is a pattern on engineering (Step S22). A first total length which is sum of lengths of the first shape in the first direction is acquired (Step S23). Same treatment is conducted on a second direction vertical to the first direction and a second total length is acquired (Step S24, S25). A score showing degree of suitability of the noticed images to a reference position image is acquired from the first total length and the second total length (Step S26). A plurality of corresponding reference position images are acquired by determining a plurality of reference positions based on the score.SELECTED DRAWING: Figure 5A |
申请公布号 |
JP2016191907(A) |
申请公布日期 |
2016.11.10 |
申请号 |
JP20160021581 |
申请日期 |
2016.02.08 |
申请人 |
SCREEN HOLDINGS CO LTD |
发明人 |
TANIGUCHI KAZUTAKA;NAKANISHI KENJI |
分类号 |
G03F9/00;H05K3/00 |
主分类号 |
G03F9/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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