发明名称 MEASURING METHOD AND APPARATUS FOR POTENTIOMETRIC MEASURING PROBES
摘要 A method and device are disclosed for measuring potentiometric measuring probes. An exemplary method includes feeding two test voltages comprising a harmonic wave Ueg with a base frequency fg and the harmonic wave Uer with a base frequency fr into two cores of a connecting cable through voltage source impedances, respectively. The voltage between an indicating electrode and a reference electrode, and the AC responding signal resulting from the two test voltages are passed to an amplifier and further to a transfer function unit having transfer functions (Hg, Hr), an A/D converter, and a Fourier transformation unit, to calculate a potential Ux and the two test responses Ug and Ur, respectively. Two calibration responses Uehg and Uehr are determined, wherein Uehg includes a product of Ueg and Hg, and wherein Uehr includes a product of Uer and Hr. Functional expressions are established for the test responses Ug and Ur, and the internal resistances Rg and Rr are determined by simultaneously solving equations having the unknown resistances Rg and Rr and capacitances C1 and C2. Accurate measurement of the internal resistance of the electrode can be achieved even with a relatively long connecting cable.
申请公布号 US2009157338(A1) 申请公布日期 2009.06.18
申请号 US20080334008 申请日期 2008.12.12
申请人 METTLER-TOLEDO AG 发明人 WANG CHANGLIN
分类号 G01R35/00;G01R23/16;G01R27/00;G06F19/00 主分类号 G01R35/00
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