发明名称 PHASE-CONTRAST MICROSCOPE
摘要 PROBLEM TO BE SOLVED: To provide a phase-contrast microscope which is added with additional arrangements, such as an autofocusing device, an introducing section of a laser light source or an image output port etc., and with which phase-contrast observation can be performed while using the additional arrangements. SOLUTION: The phase-contrast microscope 1 has the light source, an illumination optical system 2 for irradiating a specimen with light from the light source, a zonal light shielding means arranged in a pupil position of the illumination optical system 2 , an objective lens 4, and an observatory optical system 3 having transmission lenses 13a, 15 transmitting the pupil position P1 of the objective lens 4 of a pupil conjugation position P2, permits installation of the observatory additional arrangements in the observatory optical system 3 and performs the phase-contrast observation of the specimen. The phase-contrast microscope is installed between the pupil position P1 and the pupil conjugation position P2 and has a correction means 13b for maintaining the pupil conjugation position P2 of the object lens 4 when the position in the optical axis direction of the objective lens 4 is changed. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007219319(A) 申请公布日期 2007.08.30
申请号 JP20060041519 申请日期 2006.02.17
申请人 NIKON CORP 发明人 FUTABOSHI TOSHIAKI
分类号 G02B21/06 主分类号 G02B21/06
代理机构 代理人
主权项
地址