Testing a device under test by sampling its clock and data signal,申请号EP20050103301-传众专利搜索

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发明名称	Testing a device under test by sampling its clock and data signal
摘要
申请公布号	EP1715355(B1)	申请公布日期	2007.10.17
申请号	EP20050103301	申请日期	2005.04.22
申请人	AGILENT TECHNOLOGIES, INC.	发明人	LAQUAI, BERND;MOHR, JOERG-WALTER
分类号	G01R31/3193	主分类号	G01R31/3193
代理机构		代理人
主权项
地址

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