发明名称 MANUFACTURING METHOD OF MIRROR ARRANGEMENT FOR SEMICONDUCTOR LITHOGRAPHY, AND MIRROR ARRANGEMENT FOR REFLECTION OF ELECTROMAGNETIC RADIATION
摘要 <P>PROBLEM TO BE SOLVED: To provide a manufacturing method of a mirror arrangement for semiconductor lithography, and to provide the mirror arrangement for the reflection of electromagnetic radiation. <P>SOLUTION: Two or more optical layers 5 aimed at forming a mirror region 4 are formed at a front face 3 of a board 2. Before the application of the optical layer 5, the front face 3 of the board 2 is processed at a first work step so that the front face 3 has the dimensional accuracy demanded. In a second work step, at least one electric conductive path 7 is applied on the front face 3 of the board 2 at an exterior of an optical active area A. In order to rectify the variation of dimensional accuracy, caused by application of the electric conductive path 7, the front face 3 of the board 2 is subjected to post-treatment, in at least a region near to the electric conductive path 7 in a third work step, and the optical layer 5 is applied in a fourth work step. <P>COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008166694(A) 申请公布日期 2008.07.17
申请号 JP20070240237 申请日期 2007.09.14
申请人 CARL ZEISS SMT AG 发明人 GROSS TORSTEN;KWAN YIM-BUN-PATRICK;MUELLENDER STEPHAN
分类号 H01L21/027 主分类号 H01L21/027
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