发明名称 |
METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To provide a method of manufacturing a semiconductor device for selectively controlling Vth to a plurality of types of MOSFETs having a desired different Vth (threshold voltage). SOLUTION: The method of manufacturing the semiconductor device includes: a step of forming a first gate insulation film 45 including silicon dioxide and a second one 46 including a metal oxide in a region for forming the plurality of kinds MOSFETs Tr1-Trn on a semiconductor substrate 40; a step of forming a gate electrode 47 including polysilicon on the first and second insulation films 45, 46; and further a step of forming the gate electrode 47 before performing heat treatment so that temperature of at least one of MOSFETs Trn differs from that of other types of MOSFETs Tr1-Tr3 in the plurality of types of MOSFETs Tr1-Trn. COPYRIGHT: (C)2010,JPO&INPIT
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申请公布号 |
JP2010021365(A) |
申请公布日期 |
2010.01.28 |
申请号 |
JP20080180625 |
申请日期 |
2008.07.10 |
申请人 |
FUJITSU MICROELECTRONICS LTD |
发明人 |
HAYASHI GUN;MOMIYAMA YOICHI |
分类号 |
H01L21/8234;H01L21/265;H01L21/28;H01L21/8238;H01L21/8244;H01L27/088;H01L27/092;H01L27/11;H01L29/423;H01L29/49 |
主分类号 |
H01L21/8234 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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