发明名称 METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a method of manufacturing a semiconductor device for selectively controlling Vth to a plurality of types of MOSFETs having a desired different Vth (threshold voltage). SOLUTION: The method of manufacturing the semiconductor device includes: a step of forming a first gate insulation film 45 including silicon dioxide and a second one 46 including a metal oxide in a region for forming the plurality of kinds MOSFETs Tr1-Trn on a semiconductor substrate 40; a step of forming a gate electrode 47 including polysilicon on the first and second insulation films 45, 46; and further a step of forming the gate electrode 47 before performing heat treatment so that temperature of at least one of MOSFETs Trn differs from that of other types of MOSFETs Tr1-Tr3 in the plurality of types of MOSFETs Tr1-Trn. COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP2010021365(A) 申请公布日期 2010.01.28
申请号 JP20080180625 申请日期 2008.07.10
申请人 FUJITSU MICROELECTRONICS LTD 发明人 HAYASHI GUN;MOMIYAMA YOICHI
分类号 H01L21/8234;H01L21/265;H01L21/28;H01L21/8238;H01L21/8244;H01L27/088;H01L27/092;H01L27/11;H01L29/423;H01L29/49 主分类号 H01L21/8234
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