发明名称 |
SUBSTRATE CLEANING DEVICE AND SUBSTRATE CLEANING METHOD |
摘要 |
PROBLEM TO BE SOLVED: To provide a substrate cleaning device which prevents a surface of a substrate from being contaminated by foreign objects.SOLUTION: A substrate cleaning device 10 includes: a stage 12 which supports a wafer W from the back side; a cover 13 which covers a surface of the supported wafer W and maintains a gap G in between itself and the surface of the wafer W; and a gas cluster shower 15 which radiates gas cluster 25 toward a bevel part 14 on the back side of the supported wafer W. The cover 13 has a downflow gas jet port 19 which opens to the gap G in a position facing a center part of the wafer W.SELECTED DRAWING: Figure 1 |
申请公布号 |
JP2016219647(A) |
申请公布日期 |
2016.12.22 |
申请号 |
JP20150104392 |
申请日期 |
2015.05.22 |
申请人 |
TOKYO ELECTRON LTD |
发明人 |
YOSHIDA RYOICHI;TSUJIMOTO HIROSHI;ONO KUMIKO;HOANG ANH TRUONG;SAITO MICHISHIGE;SATO DAIKI |
分类号 |
H01L21/304;H01L21/302 |
主分类号 |
H01L21/304 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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