发明名称 SEMICONDUCTOR MODULE
摘要 Control ICs for controlling IGBTs include overheat detection comparators that determine an overheated state of the case, in addition to overheat detection comparators that determine an overheated state of chips of the IGBTs. Outputs of the overheat detection comparators are input into an AND circuit, and when all of the overheat detection comparators determine the overheated state of the case, the AND circuit outputs a protection operation signal of high level, and an alarm output circuit outputs an alarm signal. The overheated state of the chips and the overheated state of the case are detected on the basis of chip temperatures measured by temperature detection diodes which are provided with the IGBTs respectively, and therefore a temperature detection IC for case overheat protection is unnecessary, and detection accuracy of the case overheat improves.
申请公布号 US2016372454(A1) 申请公布日期 2016.12.22
申请号 US201615255127 申请日期 2016.09.01
申请人 FUJI ELECTRIC CO., LTD. 发明人 MINAGAWA Kei
分类号 H01L27/02;H02M7/539 主分类号 H01L27/02
代理机构 代理人
主权项 1. A semiconductor module comprising: a plurality of switching elements provided with respective temperature detection elements for chip temperature detection, a plurality of diodes for protecting the switching elements, and a plurality of control circuits for controlling the switching elements, in one package, wherein the control circuits include respective comparators that compare temperatures detected by the temperature detection elements with a predetermined reference temperature for a case, and at least one of the control circuits includes a logical AND circuit that receives outputs of at least two of the comparators and determines case overheat based on the outputs of the at least two comparators.
地址 Kawasaki-shi JP
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