| 发明名称 |
TEST APPARATUS, TEST METHOD AND METHOD OF MANUFACTURING MAGNETIC MEMORY |
| 摘要 |
According to one embodiment, a test apparatus includes an interface portion to which a magnetic memory with a memory cell array is connected, the memory cell array including a center area and a peripheral area, the center area being located inside an edge of the memory cell array by a predetermined value, and a controller controlling a test of the magnetic memory. The controller is configured to execute the test for one of the peripheral area and the center area base on a kind of the test. |
| 申请公布号 |
US2016372212(A1) |
申请公布日期 |
2016.12.22 |
| 申请号 |
US201615067774 |
申请日期 |
2016.03.11 |
| 申请人 |
KABUSHIKI KAISHA TOSHIBA |
发明人 |
KISHI Tatsuya |
| 分类号 |
G11C29/44;G11C11/16 |
主分类号 |
G11C29/44 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. A test apparatus comprising:
an interface portion to which a magnetic memory with a memory cell array is connected, the memory cell array including a center area and a peripheral area, the center area being located inside an edge of the memory cell array by a predetermined value; and a controller controlling a test of the magnetic memory, wherein the controller is configured to: execute the test for one of the peripheral area and the center area base on a kind of the test. |
| 地址 |
Tokyo JP |
