发明名称 SEMICONDUCTOR STRUCTURE WITH INTEGRATED PASSIVE STRUCTURES
摘要 A metal-oxide-semiconductor field-effect transistor (MOSFET) with integrated passive structures and methods of manufacturing the same is disclosed. The method includes forming a stacked structure in an active region and at least one shallow trench isolation (STI) structure adjacent to the stacked structure. The method further includes forming a semiconductor layer directly in contact with the at least one STI structure and the stacked structure. The method further includes patterning the semiconductor layer and the stacked structure to form an active device in the active region and a passive structure of the semiconductor layer directly on the at least one STI structure.
申请公布号 US2016307918(A1) 申请公布日期 2016.10.20
申请号 US201615196681 申请日期 2016.06.29
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 Chou Anthony I.;Kumar Arvind;Mo Renee T.;Narasimha Shreesh
分类号 H01L27/12;H01L21/28;H01L29/49;H01L29/423;H01L29/06;H01L21/265;H01L21/3105;H01L21/3205;H01L21/84;H01L21/3065;H01L21/311;H01L21/3213;H01L27/06;H01L23/525;H01L29/51;H01L21/762 主分类号 H01L27/12
代理机构 代理人
主权项 1. A method, comprising: forming a high-k dielectric material on a semiconductor material; forming a metal gate material on the high-k material; forming a semiconductor layer on the metal gate material; forming a stacked structure in an active region by patterning the semiconductor material, high-k dielectric material, metal gate material and semiconductor layer; forming a liner on a top and side surfaces of the stacked structure in the active region, and exposed surfaces of a buried oxide layer or bulk silicon; forming an insulator layer over the liner; planarizing the insulator layer to form insulator regions, separated by the stacked structure formed in the active region; recessing the insulator regions to form STI structures; forming a second semiconductor material over the STI structures and the semiconductor layer of the stacked structure in the active region; and performing well implantation processes through the second semiconductor material.
地址 Armonk NY US