CIRCUITS, METHODS, AND COMPUTER PROGRAMS TO DETECT MECHANICAL STRESS AND TO MONITOR A SYSTEM

摘要

Embodiments provide a circuit, a method, and a computer program configured to detect mechanical stress and a circuit, a method, and a computer program configured to monitor safety of a system. The detection circuit is configured to monitor a mechanical stress level of a semiconductor circuit. The detection circuit comprises a stress monitor module configured to monitor a signal comprising mechanical stress level information of the semiconductor circuit, a reference module to generate a reference signal, and a calibration module configured to modify at least one of the stress signal or the reference signal based on calibration information for the semiconductor circuit to obtain a at least one modified signal. The detection circuit further comprises an activation signal generator configured to generate an activation signal comprising activation information related to the mechanical stress level of the semiconductor circuit depending on a relation between the modified signal, and the stress signal or the reference signal.

主权项

1. A detection circuit configured to monitor a mechanical stress level of a semiconductor circuit, the detection circuit comprising:
a stress monitor module configured to monitor a stress signal comprising mechanical stress level information of the semiconductor circuit; a reference module configured to provide a reference signal; a calibration module configured to modify at least one of the stress signal or the reference signal based on calibration information for the semiconductor circuit to obtain at least one modified signal; and an activation signal generator configured to generate an activation signal comprising activation information related to the mechanical stress level of the semiconductor circuit depending on a relation between the modified signal, and the stress signal or the reference signal.