Computer-aided simulation method for atomic-resolution scanning seebeck microscope (SSM) images

摘要

A computer-aided simulation method for an atomic-resolution scanning Seebeck microscope (SSM) image is provided. In the computer-aided simulation method, a computer may calculate a local thermoelectric voltage for a position of a voltage probe, to acquire an SSM image corresponding to the position.

主权项

1. A computer-aided simulation method for a scanning Seebeck microscope (SSM) image, wherein a computer calculates a local thermoelectric voltage for a position of a voltage probe in a material surface, to acquire the SSM image corresponding to the position, using the following equation:V⁡(r)=∫S⁡(r;r′)⁢∇T⁡(r;r′)·r′-rr′-r3⁢d3⁢r′ in which V(r) denotes the local thermoelectric voltage, S(r; r′) denotes a local Seebeck coefficient, ∇T(r; r′) denotes a temperature gradient radially weighted by a factor of 1 r2, r denotes a position vector measured from a point voltage probe, r′ denotes material internal coordinates, |r′−r| denotes an absolute value of r′−r, and d3r′ denotes a volume integral.