发明名称 METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a method for manufacturing a semiconductor device capable of simultaneously forming an enhanced FET and a depressed FET. SOLUTION: The method for manufacturing the semiconductor device comprises a step of forming a first impurity region of an impurity concentration to become a channel region of the first FET by first ion implanting on the surface of a semiconductor substrate; a step of forming a source region, a drain region of the first FET by second ion implanting for raising the impurity concentration of the first impurity region in the first impurity region except a region to be formed with the channel of at least the first FET of the first impurity region, and a second impurity region of an impurity concentration to become a channel region of the second FET; a step of forming a gate electrode on the channel regions of the first and second FETS; and a step of forming a source electrode and a drain electrode connected directly to the second impurity region or via an ohmic junction region.
申请公布号 JP2002158235(A) 申请公布日期 2002.05.31
申请号 JP20000353942 申请日期 2000.11.21
申请人 NEW JAPAN RADIO CO LTD 发明人 SANO NOBUYUKI;KATO TAKESHI
分类号 H01L29/812;H01L21/338;(IPC1-7):H01L21/338 主分类号 H01L29/812
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