发明名称 |
METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To provide a method for manufacturing a semiconductor device capable of simultaneously forming an enhanced FET and a depressed FET. SOLUTION: The method for manufacturing the semiconductor device comprises a step of forming a first impurity region of an impurity concentration to become a channel region of the first FET by first ion implanting on the surface of a semiconductor substrate; a step of forming a source region, a drain region of the first FET by second ion implanting for raising the impurity concentration of the first impurity region in the first impurity region except a region to be formed with the channel of at least the first FET of the first impurity region, and a second impurity region of an impurity concentration to become a channel region of the second FET; a step of forming a gate electrode on the channel regions of the first and second FETS; and a step of forming a source electrode and a drain electrode connected directly to the second impurity region or via an ohmic junction region.
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申请公布号 |
JP2002158235(A) |
申请公布日期 |
2002.05.31 |
申请号 |
JP20000353942 |
申请日期 |
2000.11.21 |
申请人 |
NEW JAPAN RADIO CO LTD |
发明人 |
SANO NOBUYUKI;KATO TAKESHI |
分类号 |
H01L29/812;H01L21/338;(IPC1-7):H01L21/338 |
主分类号 |
H01L29/812 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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