| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor integrated circuit device equipped with a test circuit of high performance while suppressing the increase of an occupied area. SOLUTION: The arranging positions of a cell constituting a test objective circuit, and a non-connected cell prepared for the constitution of the test circuit, are determined and, thereafter, the connecting relation of the non-connected cell prepared for the constitution of the test circuit is determined based on these arrangement informations to constitute the test circuit, whereby the semiconductor integrated circuit is provided as equipped with the test circuit. COPYRIGHT: (C)2007,JPO&INPIT
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